IC芯片EMC电磁兼容测试标准

一、IEC 61967系列标准为电磁发射测量标准，包括如下9项标准：

IEC 61967-1

    IEC 61967-1: 通用条件和定义

    IEC 61967-1-1:通用条件和定义-近场扫描数据交换格式

    IEC 61967-2:辐射发射测量-TEM小室和宽带TEM小室法

    IEC 61967-3:辐射发射测量-表面扫描法

    IEC 61967-4: 传导发射测量-1Ω/150Ω直接耦合法

    IEC 61967-4-1:传导发射测量-1Ω/150Ω直接耦合法和应用指南

    IEC 61967-5:传导发射测量-法拉第笼法WFC

    IEC 61967-6:传导发射测量-磁场探头法

    IEC 61967-8:辐射发射测量-带状线法

二、IEC 62132系列标准为电磁抗扰度测量标准，包括如下7项标准：

IEC 62132-1

    IEC 62132-1: 通用条件和定义

    IEC 62132-2: 辐射抗扰测量-TEM室和GTEM室法

    IEC 62132-3: 大电流注入法BCI

    IEC 62132-4: 射频功率直接注入法

    IEC 62132-5: 法拉第笼法WFC

    IEC 62132-8:辐射抗扰测量-带状线法

    IEC 62132-9:辐射抗扰测量-表面扫描法

三、IEC 62215系列标准为脉冲抗扰度测量标准，包括如下2项标准：

    IEC 62215-2:同步瞬态注入法

    IEC 62215-3:非同步瞬态注入法

IEC标准委员会的国际标准类型汇总
IEC 61967 Integrated circuits-Measurement of electromagnetic emissions, 150 kHz to 1 GHz(电磁发射标准系列)
Part 1:General conditions and definitions
Part 2:Measurement of radiated emissions -TEM cell and wideband TEM cell method
Part 3-TS:Measurement of radiated emissions -Surface scan method
Part 4:Measurement of conducted emissions -1 Q/150 0 direct coupling method
Part 4-1-TR:Application guidance to IEC 61967-4
Part 5:Measurement of conducted emissions -Workbench Faraday Cage method
Part 6: Measurement of conducted emissions -Magnetic probe method
Part 8: Measurement of radiated emissions - IC stripline method

IEC 62132 Integrated circuits-Measurement of electromagnetic immunity, 150 kHz to 1 GHz(电磁抗扰度标准系列)
Part 1:General conditions and definitions
Part 2. Measurement of Radiated Immunity - TEM Cell and Wideband TEM Cell Method
Part 3: Bulk current injection (BCl) method
Part 4: Direct RF power injection method
Part 5:Workbench Faraday cage method
Part 8: Measurement of radiated immunity - IC stripline method
Part 9-TS: Measurement of radiated immunity - Surface scan method

IEC 62215 Integrated circuits-Measurement of impulse immunity (脉冲抗扰度标准-EFT和surge)
Part 2: synchronous transient injection method
Part 3: Non-synchronous transient injection method