IEC 61326-3-1 安全相关功能（功能安全）的设备抗扰度要求 ...

IEC 61326-3-1:2017
Electrical equipment for measurement, control and laboratory use - EMC requirements – Part 3-1: Immunity requirements for safety-related systems and for equipment intended to perform safety-related functions (functional safety) – General industrial applications

IEC 61326-3-1 安全相关功能（功能安全）的设备抗扰度要求 ...

用于测量、控制和实验室的电气设备 - EMC要求 - 第3-1部分：安全相关系统和用于执行安全相关功能（功能安全）的设备抗扰度要求 - 一般工业应用

IEC 61326-3-1：2017 涵盖 IEC 61326-1 范围内的所有设备，但仅限于用于工业应用的系统和设备，这些系统和设备旨在执行 IEC 61508 和 SIL 1-3 中定义的安全功能。
第二版取消并取代了2008年出版的第一版。此版本构成技术修订。与上一版本相比，该版本包括以下重大技术变化：
- 根据IEC 61000-4-3将射频电磁场测试的频率范围扩展到6 GHz，
- 根据通用标准IEC 61000-6-7，将性能标准FS替换为DS，
- 添加表1 - 在应用性能标准DS时要考虑的方面，
- 包括根据 IEC 61000-4-34 对电流消耗> 16 A 的设备的抗扰度测试，
- 更新表 8 - 移动发射器和 ISM 设备的频率范围，
- 更新图 A.1 和图 1 以提高可读性

标准规范引用
IEC 61326-1, Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 1: General requirements

IEC 61000-6-2, Electromagnetic compatibility (EMC) - Part 6-2: Generic standards - Immunity standard for industrial environments

IEC 61326-3-2, Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 3-2: Immunity requirements for safety-related systems and for equipment intended to perform safety-related functions (functional safety) - Industrial applications with specified electromagnetic environment

IEC 61000-4-2:2008, Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test

IEC 61000-4-3:2020, Electromagnetic compatibility (EMC) - Part 4-3 : Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test

IEC 61000-4-4:2012, Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test

IEC 61000-4-5:2014+AMD1:2017 CSV Consolidated version, Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test

IEC 61000-4-6:2013, Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

IEC 61000-4-8:2009 RLV Redline version, Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test

IEC 61000-4-11:2020 RLV Redline version, Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase

IEC 61000-4-16:2015, Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz

IEC 61000-4-29:2000 , Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

IEC 61000-4-34:2005+AMD1:2009 CSV Consolidated version, Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase

Table 1-Reaction of EUT during test 测试期间 EUT 的反应

Test	Reaction of EUT during test	How to continue with testing
Transient a	The EUT goes to a defined slate and an interaction of the user is needed to continue operation. 需要用户交互才能继续操作	The EUT shall be brought back to normal operation and the test shall be repeated 3 times with this test level and polarity and the EUT shall react in a way that complies with performance criterion DS each time. In this case, the test shall be continued with the next test level or polarity according to the basic standard. EUT 应恢复正常运行，并以该测试电平和极性重复测试 3 次
	The EUT goes to a defined state and is permanently damaged. 永久损坏	The EUT shall be replaced or repaired and the test shall be repeated 3 times with this test level and polarity and the EUT shall react in a way that complies with performance criterion DS each time. In this case, the test shall be continued with the next test level or polarity according to the basic standard. 应更换或修理 EUT，并以该试验等级和极性重复试验 3 次
Continuous b	The EUT goes to a defined slate at a certain test frequency as described under a) 2) in 6.1.	The EUT shall be re-lesled 3 times at that frequency and the EUT shall react in a way that complies with performance criterion DS each time.If the EUT reacts each time in the same way, the subsequent frequencies may be tested only one time per frequency.
a Tests according IEC 61000-4-2, IEC 61000-4-4, IEC 61000-4-5, IEC 61000-4-11, IEC 61000-4-29, IEC 61000-4-34. b Tests according IEC 61000-4-3, IEC 61000-4-6, IEC 61000-4-8, IEC 61000-4-16.

Table 2 一 Immunity test requirements 一 Enclosure port

	Phenomenon	Basic standard	Tests for functions intended for safety applications Test value - Performance criterion
1.1	Electrostatic discharge (ESD)	IEC 61000-4-2	± 6 kV contact discharge a, b± 8 kV air discharge a> b	DS
1.2	Electromagnetic field	IEC 61000-4-3	20 V/m (80 MHz to 1 GHz, 1 kHz (80 % AM)) c 10 V/m (1,4 GHz to 2 GHz, 1 kHz (80 % AM)) c3 V/m (2,0 GHz to 6,0 GHz, 1 kHz (80 % AM)) c	DS
1.3	Rated power frequency magnetic field	IEC 61000-4-8	30 A/m d	DS
a These values shall be applied in accordance with the environmental conditions described in IEC 61000-4-2 on parts which may be accessible by persons other than staff working in accordance with defined procedures for the control of ESD but not to equipment where access is limited to appropriately trained personnel only. b For equipment intended to be used in SIL 3 applications, the number of discharges at the highest level shall be increased by a factor of 3 compared to the number as given in the basic standard. c These test values shall be applied in frequency ranges as given in Table 8. ISM frequencies shall be taken into account on an individual basis. d Applicable only to equipment containing devices susceptible to magnetic fields.

Table 3 - Immunity test requirements 一 Input and output AC power ports

	Phenomenon	Basic standard	Tests for functions intended for safety applications Test value - Performance criterion
2.1	Burst	IEC 61000-4-4	3 kV (5/50 ns, 5 kHz) a	DS
2.2	Surge	IEC 61000-4-5	2 kV (line to line) b- c4 kV (line to ground)bi c	DS
2.3	Conducted RF	IEC 61000-4-6	10 V (150 kHz to 80 MHz, 1 kHz (80 % AM)) d	DS
2.4	Voltage dips	IEC 61000-4-11 orIEC 61000-4-34	0 % during 1 cycle40 % during 10/12 cycles e70 % during 25/30 cycles e	DSDSDS
2.5	Short interruptions	IEC 61000-4-11orIEC 61000-4-34	0 % during 250/300 cycles e	DS
2.6	Conducted commonmode voltage	IEC 61000-4-16	1 V to 10 V, 20 dB/Decade (1,5 kHz to 15 kHz) 10 V (15 kHz to 150 kHz)	DS
a For equipment intended to be used in SIL 3 applications, the duration of the lest at the highest level shall be increased by a factor of 5 compared to the duration as given in the basic standard. b For equipment intended to be used in SIL 3 applications, the number of pulses at the highest level shall be increased by a factor of 3 compared to the number as given in the basic standard. c The required immunity level can be achieved through the use of external protection devices. Any devices used and their installation requirements shall be specified in the user documentation. d These test values shall be applied in frequency ranges as given in Table 9. ISM frequencies have to be taken into account on an individual basis. e "10/12 cycles" means "10 cycles for 50 Hz test" and "12 cycles for 60 Hz test" (and similarly for 25/30 cycles and 250/300 cycles).

Table 4 - Immunity test requirements 一 Input and output DC power ports

	Phenomenon	Basic standard	Tests for functions intended for safety applications Test value - Performance criterion
3.1	Burst	IEC 61000-4-4	3 kV (5/50 ns, 5 kHz) a	DS
3.2	Surge	IEC 61000-4-5	1 kV (line to line) b-c2 kV (line to ground) bi c	DS
3.3	Conducted RF	IEC 61000-4-6	10 V (150 kHz to 80 MHz, 1 kHz (80 % AM))d	DS
3.4	Conducted common mode voltage	IEC 61000-4-16	1 V to 10 V, 20 dB/Decade (1,5 kHz to 15 kHz)10 V (15 kHz to 150 kHz)10 V (DC, 16 2/3 Hz, 50/60 Hz and 150/180 Hz)100 V short duration (1 s. DC, 16 2/3 Hz and 50/60 Hz)	DS
3.5	Voltage dips	IEC 61000-4-29	40 % UT for 10 ms	DS
3.6	Short interruptions	IEC 61000-4-29	0 % t/T for 20 ms	DS
DC connections between parts of equipment/system which are not connected to a DC distribution network are treated as I/O signal/control ports (see Tables 5 and 6).
a For equipment intended to be used in SIL 3 applications, the duration of the test at the highest level shall be increased by a factor of 5 compared to the duration as given in the basic standard. b For equipment intended to be used in SIL 3 applications, the number of pulses at the highest level shall be increased by a factor of 3 compared to the number as given in the basic standard. c The required immunity level can be achieved through the use of external protection devices. Any devices used and their installation requirements shall be specified in the user documentation. d These test values shall be applied in frequency ranges as given in Table 9 used for mobile transmitters in general. ISM frequencies shall be taken into account on an individual basis.

Table 5 一 Immunity test requirements - I/O signal/control ports

	Phenomenon	Basic standard	Tests for functions intended for safety applications Test value - Performance criterion
4.1	Burst	IEC 61000-4-4	2 kV (5/50 ns, 5 kHz) a-b	DS
4.2	Surge	IEC 61000-4-5	2 kV (line to ground)Ci d< ®	DS
4.3	Conducted RF	IEC 61000-4-6	10 V (150 kHz to 80 MHz, 1 kHz (80 % AM))f	DS
4.4	Conducted common mode voltage c ‘9	IEC 61000-4-16	1 V to 10 V, 20 dB/Decade (1,5 kHz to 15 kHz)10 V (15 kHz to 150 kHz)10 V (DC, 16 2/3 Hz, 50/60 Hz and 150/180 Hz)100 V short duration (1 s. DC, 16 2/3 Hz and 50/60 Hz)	DS
a Only in case of lines > 3 m. b For equipment intended to be used in SIL 3 applications, the duration of the test at the highest level shall be increased by a factor of 5 compared to the duration as given in the basic standard. c Only in case of long-distance lines (see 3.10 of IEC 61326-1:2012). d For equipment intended to be used in SIL 3 applications, the number of pulses at the highest level shall be increased by a factor of 3 compared to the number as given in the basic standard. e The required immunity level can be achieved through the use of external protection devices. Any devices used and their installation requirements shall be specified in the user documentation. f These test values shall be applied in frequency ranges as given in Table 9 used for mobile transmitters in general. ISM frequencies shall be taken into account on an individual basis. g Only in case of earthed systems or equipment, respectively.

Table 6 - Immunity test requirements - I/O signal/control ports connected direct to power supply networks

	Phenomenon	Basic standard	Tests for functions intended for safety applications Test value - Performance criterion
5.1	Burst	IEC 61000-4-4	3 kV (5/50 ns, 5 kHz) 8	DS
5.2	Surge	IEC 61000-4-5	2 kV (line to line) b< c, d4 kV (line to ground) bi c-d	DS
5.3	Conducted RF	IEC 61000-4-6	10 V (150 kHz to 80 MHz, 1 kHz (80 % AM)) e	DS
5.4	Conducted common mode voltage	IEC 61000-4-16	1 V to 10 V, 20 dB/Decade (1,5 kHz to 15 kHz)10 V (15 kHz to 150 kHz)10 V (DC, 16 2/3 Hz, 50/60 Hz and 150/180 Hz)100 V short duration (1 s, DC, 16 2/3 Hz and 50/60 Hz)	DS
a For equipment intended to be used in SIL 3 applications, the duration of the lest at the highest level shall be increased by a factor of 5 compared to the duration as given in the basic standard. b For equipment intended to be used in SIL 3 applications, the number of pulses at the highest level shall be increased by a factor of 3 compared to the number as given in the basic standard. c The required immunity level can be achieved through the use of external protection devices. Any devices used and their installation requirements shall be specified in the user documentation. d The coupling network AC/DC power lines shall be used. e These test values shall be applied in frequency ranges as given in Table 9 used for mobile transmitters in general. ISM frequencies shall be taken into account on an individual basis.

Table 7 - Immunity test requirements - Functional earth port

	Phenomenon	Basic standard	Tests for functions intended for safety applications Test value - Performance criterion
6.1	Burst	IEC 61000-4-4	2 kV (5/50 ns, 5 kHz)a	DS

a, For equipment intended to be used in SIL 3 applications, the duration of the test at the highest level shall be increased by a factor of 5 compared to the duration as given in the basic standard.

Table 8 一 Frequency ranges of mobile transmitters and ISM equipment for tests with electromagnetic fields

Test frequency rangeMHz	For information only			Test frequency rangeMHz	For information only
	Frequency range MHz	Service			Frequency range MHz	Service
84,000	83,996- 84,004	ISMISM (UK only)		1 428 - 2 700 continued	1 476- 1 5111 525 - 1 5591 627 - 1 6611 710- 1 785	3.9G/LTE
137 - 174	137 一174	Mobile & SRD
	151,820 - 151,880	MURS
	154,570 - 154,600	MURS			1 710 - 1 785	GSM3G/UMTS3G/FOMA3G/HSPA
	167,992 - 168,008	ISM UK only
219,500	219-220	AMATEUR
380 -400	380 - 400	TETRA
420 -470	420 -470	AMATEUR			1 805 - 1 880	GSM3G/UMTS 3G/FOMA 3G/HSPA3.9G/LTE
	433.05-434,79	ISM(Region 1 only)
	450 -470	4G/LTE-A
698 - 960	698 - 894	3G/UMTS3.9G/LTE
					1 900 - 2 025	3G/UMTS3G/FOMA3.9G/LTE
	746 - 845	TETRA
	825 - 845	TETRA
	830 - 840	3G/FOMA			2 110-2 200	3G/UMTS3G/FOMA3.9G/LTE
	860 -915	3.9G/LTE
	870 - 876	TETRA
	860 - 960	RFID			2 300 - 2 450	AMATEUR
	886 - 906	ISM(UK only)			2 400 - 2 500	ISM
					2 300 - 2 400	4G/LTE-A3.9G/LTE
	880 -915	GSM3G/FOMA3G/HSPA
					2 500 - 2 690	3.9G/LTE
				3 300 - 3 600	3 300 - 3 500	AMATEUR
	915-921	NADC			3 400 - 3 600	4G/LTE-A
	902 一 928	ISM(Region 2 only)		5 150-5 925	5 150-5 350	HIPERLAN
					5 470 - 5 725	HIPERLAN
	925 - 960	GSM3G/HSPA			5 650 - 5 925	AMATEUR
					5 725 - 5 875	ISM
1 240 - 1 300	1 240 - 1 300	AMATEUR			5 795-5 815	RTTT
1 428 - 2 700	1 428 - 1 496	3.9G/LTE3G/HSPA3.9G/LTE
For those frequency bands where a single test frequency is indicated in the test frequency range column, the test shall be performed at that frequency only. If a frequency range is indicated in the test frequency range column, that frequency range shall be stepped through with a step size not larger than 1 % of the actual frequency. NOTE 1 For the tests, the modulation scheme as given in the basic standard is applied. Other modulation parameters are possible. NOTE 2 For more information about frequency allocation per region, see IEC 61000-2-5 or ITU publications.

Table 9 - Frequency ranges of mobile transmitters and ISM equipment for the conducted RF tests

Test frequency MHz	For information only Frequency rangeMHz	Purpose
3,39	3,370-3,410	ISM Netherlands only
6,780	6,765 - 6,795	ISM
13,560	13,553 - 13,567	ISM
27,120	26,957 - 27,283	ISM/CB/SRD
40,680	40,66 -40,70	ISM/SRD

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