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ESA - Electro Magnetic Compatibility - 汽车电子电磁兼容
All components shall be tested at atemperature of 23 ± 5 °C. The operating voltage shall be 13 ± 1 V for 12 Vcomponents and 26 ± 2 V for 24 V components. Where the test methods standarddoes not require otherwise, all components shall be operated in a configurationas close to that of the end application as possible. The DUT must includeproper loads for outputs, all inputs, sensing medium for sensors, loads onmotors, etc. These loads and excitations shall be shown in the test plan.Grounding shall be as in the intended application. Grounding shall be the samefor immunity and emissions testing. Any modifications required to pass shallalso be included in the final application. Occasionally issues with ancillaryequipment causes issues unrelated to the DUT. In these cases, the issue must beshown to be from the ancillary equipment not the DUT, it cannot be assumed.Components with different circuitry for 12V and 24V applications must be testedin both modes. Conducted Emissions - 传导发射 Test shall be conducted in accordancewith CISPR 25 recording the greatest of 5 separate readings. The emissionsshall be measured from Batt (+) and Batt (-). The limits for the testing areshown in Figure 11 and are derived from CISPR 25 Class 3.
Table 8: Showsconducted emissions limits from 150 kHz to 108 MHz Far Field Radiated Emissions - 辐射发射（远场） Far field radiated emissions shall be tested in accordance with ICES-003 Issue 7, CISPR 16-2-3 and CISPR 32 ed2.1:2019. The limits are shown in Figure 9 and Figure 10. The component must be rotated 360 degrees continuously or in 15-degree increments. The antenna height will move from 1 m to 4 m in 1 m increments. This will be done for both antenna polarities recording the greatest of 5 separate readings. This shall be documented in the test plan and approved by Caterpillar EMC personnel. If the highest frequency used or generated in a DUT is less than 1 GHz, then HFFF shall be tested up to 6 GHz. If the highest frequency used or generated in a DUT is over 1 GHz the device shall be tested to 6 GHz or 5 times the highest frequency used or generated, whichever is greater, up to a maximum of 40 GHz. The limits for the additional frequency measurements are shown in Figure 10. Above 1 GHz the DUT must comply with both the Avg and Peak limits. The limits above 6 GHz continue at the same amplitude as from 1 to 6 GHz, up to 40 GHz.
High Frequency Immunity - 电磁辐射抗扰度 This test will be conducted accordingto ISO 11452-2 with a test level shown in Table 6 with functional status A. Thecomponent will be tested in three orthogonal axes with the antenna inhorizontal and vertical polarity for each test at an antenna distance of 1m.
Table 6: Showsthe permissible test methods for immunity tests Conducted Transients - 传导瞬态干扰 These tests are for devices connecteddirectly to the battery, including through ECM drivers without clampingability. Tests to be conducted according to ISO 7637-2 and ISO 16750-2 withfunctional status shown in Table 7. Load dump may be conducted with a clampedvoltage as per ISO13766-1:2018 and ISO 16750-2:2012, but the device may thennot be used on machines with an unclamped alternator, or an alternator clampedat a higher voltage than tested.
Table 7: Showsthe functional status requirement during conducted transients Note 1: Withoutuncommanded movement and without creating hazardous machine behavior Test shall be conducted in accordancewith ISO 13766 with limits shown in Figure 8. The component shall be tested atan antenna distance of 1m and powered through LISNs. The component shall betested in all three orthogonal axes with each antenna polarity recording thegreatest of 5 separate readings. The limits displayed are for single sampletests. Multiple samples will increase the limit by 2 dB throughout thefrequency band. Operational - ESA操作运行时候的ESD 静电 Operational ESD shall test bothdirect and indirect contact discharge in addition to air discharge inaccordance with ISO 10605. All outputs shall be monitored with functionalstatus A during 4 kV discharges but may deviate from their specification forhigher voltage ESD while meeting functional status C.
Table 9: Showsthe ESD variables for operational testing *Devices whichcannot be easily touched from outside the machine do not have to be tested at150pF capacitance. Packaging and Handling - ESA运输时候的ESD 静电 Packaging and handling test shall beconducted unpowered. The device must perform within its performancespecification after the test.
Table 10: Shows the ESD variables for packaging and handling testing Medium Frequency Immunity - BCI 大电流注入 This test shall be conducted according to ISO11452-2, ISO 11452-4, or ISO 11452-5 with a test level shown in Table 6 andwith functional status A. If BCI is used it shall be testedwith common mode and differential mode per SAE J1113-4. Audio Frequency Immunity - 音频抗扰度 This test shall be conducted ISO16750-2 with a 1V alternating voltage with functional status A. |
